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New approach to account for measurement error in crystallographic likelihood targets

What is it about?

Making the best use of experimental data when determining 3D structures with X-ray crystallography requires a proper accounting for the effect of measurement errors. This new treatment overcomes problems with previous approximations used to deal with errors in photon counting in diffraction experiments.

Why is it important?

A recent trend in crystallography is to make use of weaker diffraction data, which highlights the shortcomings of existing error treatments.

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The following have contributed to this page:
Randy Read
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