X-ray Nano-CT for voids developing under compressing
What is it about?
Voids developing in TATB crystals can cause the explosive deterioration. We used X-ray nano-CT to follow the voids developing under compressing, and found the voids with higher surface roughness and irregular structures were easier to break and form new micro voids. These new voids with higher irregular structures were weaker and easier to break into smaller ones as compared to the originals, and leading to the development of voids along these weak zones.
Why is it important?
Using the X-ray nano-CT, we followed the voids developing in TATB under compressing. The experiment provides new insight into the evolution of voids within TATB crystal with high spatial resolution and excellent imaging contrast. And such technique can be further extended to other systems, such as metal fatigue under dynamic loading.