Complete analysis of 2D small-angle scattering patterns from oriented nanostructured materials
What is it about?
Small-angle X-ray scattering (SAXS) is a powerful tool to probe nano-scale structures. 2D SAXS patterns from samples with uniaxial orientation have elliptical features that are obvious only in simple systems such as dispersed rod-like molecules. We here identify and analyze the elliptical features that are often hidden in the data from plate-like and lamellar structures such as in colloidal nanoplatelets, liquid crystals and semicrystalline polymers.
Why is it important?
Analysis of ellipticity can reveal details of the mechanics of deformation and self-assembly. The complete 2D SAXS data contains central diffuse scattering (from uncorrelated structures) and discrete reflections (from long-range order). All can be fitted and parameterized with the least number of parameters in elliptical coordinates.