(function(doc, html, url) { var widget = doc.createElement("div"); widget.innerHTML = html; var script = doc.currentScript; // e = a.currentScript; if (!script) { var scripts = doc.scripts; for (var i = 0; i < scripts.length; ++i) { script = scripts[i]; if (script.src && script.src.indexOf(url) != -1) break; } } script.parentElement.replaceChild(widget, script); }(document, '

Element-sensitive nanomorphology of thin films

What is it about?

The proposed technique allows studying the morphology of thin films at a nanometer-scale and with element sensitivity. X-rays impinge the film surface at a grazing incidence and are scattered by the film. Performing such an experiment with X-rays at wavelengths near the absorption edge of a considered element allows determining the morphology of particles composed of this element.

Why is it important?

Nowadays, a huge number of multi-component thin films are elaborated. A challenge is to elucidate the morphology of such nanomaterials. This X-ray technique allows determining the nanomorphology of different components in complex materials.

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Christine Revenant
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