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Seeing buried layers and interfaces of ultra thin films

What is it about?

Novel analytical technique using X-rays to visualize buried layers and interfaces of ultra thin films.

Why is it important?

Exotic functions and properties of the materials in the ultra thin film forms are quite often influenced by some inhomogeneity of the structures, particularly at the interfaces. So far, there have been no good methods to see buried structures in the ultra thin films in non-destructive manner. The present technique can help scientists to solve many existing problems.

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The following have contributed to this page:
Kenji Sakurai
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