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New X-ray optics for new X-ray sources

What is it about?

Efficient utilization of new types of X-ray laboratory sources requires dedicated solutions of the X-ray optics for a targeted X-ray beam conditioning while collecting maximum intensity from the source and bringing it onto the sample. In particular, new schemes of the X-ray beam compression and expansion for X-ray metrology and X-ray imaging are addressed.

Why is it important?

The proposed solutions of X-ray optics outperform commercial setups and may allow to perform or pre-screen in laboratory the X-ray experiments that have been confined to synchrotron, such as real-time monitoring of processes at the nanoscale.

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The following have contributed to this page:
Matej Jergel
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