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Crystal bending in triple-Laue X-ray interferometry: experimental tests
What is it about?
We predicted that an X-ray interferometer detects the displacement field of the surface of a bent crystal. We report on the experimental confirmation of this prediction by the phase-contrast topography.
Why is it important?
The measured value of the bulk lattice parameter of 28Si using X-ray interferometry is essential to realize the kilogram by counting 28Si atoms. An analytical study of the X-ray propagation in bent crystals predicts that the measured lattice spacing refers instead to the crystal surface. We confirm experimentally this prediction.